[SystemSafety] Radiation Single Event Upsets: SEU Immunity: Is Your Design Really Safe? Commercial webinar by Microsemi

[Stachour, Paul D CCS]

Colleagues,
    While I do not work directly in this area (SEU) myself, in light of the recent discussion in this forum with-respect-to radiation single event upsets, I am forwarding this webinar announcement to the list for those who might be interested.

Paul D. Stachour
Software Quality Assurance
Detector Electronics Corporation
A UTC Fire & Security Company
6901 West 110th Street, Bloomington, MN 55438 USA
952-941-5665, x8409
Paul.Stachour at det-tronics.com<mailto:Paul.Stachour at det-tronics.com>
www.det-tronics.com

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SEU Immunity: Is Your Design Really Safe?
Join us for a Webinar on April 17


Title: SEU Immunity: Is Your Design Really Safe?
Date: Wednesday, April 17, 2013
Time: 8:00 AM - 9:00 AM PDT

Reserve your Webinar seat now at:
https://www1.gotomeeting.com/register/830266089

This webinar is intended for design engineers focused on safety-critical aviation, defense, industrial and medical applications. Webinar attendees will receive information on the risks and consequences of configuration failures caused by radiation single event upsets (SEUs) in FPGA technologies, as well as background information on the physical failure mechanisms associated with SEUs. All major FPGA programming technologies - Flash, Antifuse, and SRAM - will be discussed.
Topics will include:
"           SEU Overview - What they are and why they matter
"           Comparison of Flash, Antifuse and SRAM FPGAs and the risks of malfunction due to SEUs
"           Results of SEU tests on Flash, Antifuse, and SRAM FPGAs
About Single Event Upsets (SEUs)
SEUs are caused when sub-atomic particles such as neutrons strike the silicon substrate of an integrated circuit and cause binary code bits to flip, which can corrupt configuration cells in SRAM FPGAs and may cause catastrophic hardware malfunctions. Free neutrons are present at all levels in the atmosphere, at higher concentrations at higher altitudes, and are especially problematic at aviation altitudes. Sources of sub-atomic particles also exist in IC packaging materials. Microsemi FPGAs do not experience changes of configuration due to subatomic particles. This is in direct contrast to SRAM FPGAs, which can experience catastrophic changes of functionality due to SEUs affecting their configuration.

After registering you will receive a confirmation email containing information about joining the Webinar.
System Requirements
PC-based attendees
Required: Windows(r) 7, Vista, XP or 2003 Server
Mac(r)-based attendees
Required: Mac OS(r) X 10.6 or newer
Mobile attendees
Required: iPhone(r), iPad(r), Android(tm) phone or Android tablet


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